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Multi-band beyond-Nyquist Disturbance Rejection on a Galvanometer Scanner System
Hui Xiao
,
Xu Chen
January 2017
Cite
DOI
Type
Conference paper
Publication
Proceedings of IEEE International Conference on Advanced Intelligent Mechatronics, July 3-7 2017, Munich, Germany
disturbance observer
"beyond-Nyquist control"
additive manufacturing
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