UNIVERSITY of WASHINGTON | BOTHELL

Electrical Engineering | Science & Technology

2012

Autumn Quarter

2013

Winter Quarter

Spring Quarter

BEE 484 Sensors and Sensor Systems

This course is designed to be a survey focused on understanding a broad variety of sensor technologies (fundamental mechanisms and governing equations) and their application as systems in everyday use. This course provides both a foundation for the designer/researcher to move into a particular area of sensor technology and also a means for the user to apply appropriate sensors (type and number) for particular applications.

Topics covered: magnetic sensors, radiant sensors, mechanical sensors, electrical sensors, and sensor interface circuits.

BEE 486 Fundamentals of Integrated Circuit Technology

This course introduces the fundamentals of IC technologies. Covers the microelectronic processing technology, including evaporation, sputtering, epitaxial growth, diffusion, ion implantation, oxidation, chemical vapor deposition, and photoresists. It also introduces the design considerations for transistors, materials and process characterization, and future trends.

BEE 331 Device and Circuit I

There are four main topics covered in the course:

1. Physics of conduction in semiconductors
2. Solid-state diodes and their use in non-linear circuits
3. Physics and applications of Field Effect Transistors (FET)
4. Logic circuit design

We will begin with a study of the phenomenon of conduction in semiconductors. This provides the basis for understanding the principles of operation for two very important classes of electronic components: diodes and FETs. After a comprehensive study of these components, we will use them to design and build logic gates and more complicated circuits. By the end of this quarter you will be able to:

1. Calculate conduction properties of materials and simple device structures
2. Explain the operating principles of semiconductor diodes and FETs
3. Determine the in-circuit operating state of diodes and FETs
4. Perform large signal analysis of circuits containing semiconductor diodes and FETs
5. Use a modern schematic capture and computer-aided circuit analysis program (SPICE)
6. Calculate the performance parameters for different MOS logic families