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EE 540, Winter 2012
VLSI Testing

Class Schedule and Class Notes

Class Meeting Times and Location:
MW, 08:30-10:20, MEB 103

First day of class: Wednesday, January 04

Last day of class: Wednesday, March 07

Scheduled time for final project presentation: Tuesday March 13, 8:30 AM - 10:20 AM.

Lecture materials

The course covers materials in the textbook at a very fast rate. Materials for lectures also come from IEEE journals. Only key points from the materials will be emphasized in the lectures.

  • Reading assignments in the table below: please read these chapters / papers before the lectures.
  • Class handouts: all materials are available on the class web site unless specified otherwise. These materials are in addtion to the textbook, not a replacement.

Travel information (updated as appropriate)

The lectures on the following dates will be either skipped or delivered by a substitute speaker.

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Weekly plan and lecture notes

Class notes for specific lectures will be posted either before the week of these lectures or early in that week. So some of the links for future lectures might not be active.

Materials in the course textbook are not posted due to copyright issues.

Week of

Topics

Chapters

01/02

Class begins on W 01/04

Course information

Introduction.

Introduction (grayscale print)

1

01/09

Design for Test (DFT) techniques.

Boundary Scan test standards

Design for Test (grayscale print)

2

01/16

Monday 01/16 Holiday no class

Wednesday 1/18 snow closure

 

01/23

Guest lecture on hardware security (Professor Xinmiao Zhang)

(See also Assignments web page for more documents)

Continue Design for Test lecture

Fault models

Fault models (grayscale print)

 

Finite field review

AES architectures

Side channel attacks

01/30

Fault simulation.

Fault simulation (grayscale print).

FPGA training by Altera on 02/01

3, 4

02/06

Test generation techniques.

Test generation (grayscale print)

Test compression.

Test compression (grayscale print)

6

02/13

Test compression. continued

Design for Security (overview) (grayscale print)

Introduction to PUFs

5

02/20

Monday 02/20 Holiday no class.

Introduction to PUFs

Digital BIST. (grayscale print)

8, 9

02/27

Memory test (see textbook materials, chapter 8, posted on class discussion web page)

Test methods for high-performance systems (grayscale print)

7, 10

03/05

Test methods for high-performance systems (grayscale print)

Wrap-up and course evaluation

11, 12

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Contact the instructor at: manisoma@u.washington.edu